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GS81282Z18GB-200I 数据表(PDF) 7 Page - GSI Technology |
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GS81282Z18GB-200I 数据表(HTML) 7 Page - GSI Technology |
7 / 35 page GS81282Z18/36(GB/GD) Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. Rev: 1.01 5/2017 7/34 © 2015, GSI Technology 165-Bump BGA Pin Description Symbol Type Description A0, A1 I Address field LSBs and Address Counter Preset Inputs An I Address Inputs A18 I Address Input DQA DQB DQC DQD I/O Data Input and Output pins BA, BB, BC, BD I Byte Write Enable for DQA, DQB, DQC, DQD I/Os; active low CK I Clock Input Signal; active high CKE I Clock Enable; active low W I Write Enable; active low E1 I Chip Enable; active low E3 I Chip Enable; active low E2 I Chip Enable; active high FT I Flow Through / Pipeline Mode Control G I Output Enable; active low ADV I Burst address counter advance enable; active high ZQ I FLXDrive Output Impedance Control Low = Low Impedance [High Drive], High = High Impedance [Low Drive]) ZZ I Sleep mode control; active high LBO I Linear Burst Order mode; active low TMS I Scan Test Mode Select TDI I Scan Test Data In TDO O Scan Test Data Out TCK I Scan Test Clock MCH — Must Connect High VDD I Core power supply VSS I I/O and Core Ground VDDQ I Output driver power supply NC — No Connect |
类似零件编号 - GS81282Z18GB-200I |
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类似说明 - GS81282Z18GB-200I |
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