Supply Voltage

a

Output Voltage

a

Output Current

10 mA

Storage Temperature

b

Lead Temperature

SOT Package (Note 2)

Vapor Phase (60 seconds)

215 C

Infrared (15 seconds)

220 C

ESD Susceptibility (Note 3)

Human Body Model

2000V

Machine Model

TBD

Specified Temperature Range

(Note 4)

LM45B LM45C

b

Operating Temperature Range

LM45B LM45C

b

a

a

50 mA in the circuit of

a

Parameter

Conditions

LM45B

LM45C

(Limit)

Units

Typical

Limit

Typical

Limit

(Note 5)

(Note 5)

Accuracy

g

20

g

30

C (max)

(Note 6)

g

30

g

40

C (max)

g

30

g

40

C (max)

Nonlinearity

g

08

g

08

C (max)

(Note 7)

Sensor Gain

a

97

a

97

mV C (min)

(Average Slope)

a

103

a

103

mV C (max)

Load Regulation (Note 8)

g

35

g

35

mVmA (max)

Line Regulation

a

g

080

g

080

mVV (max)

(Note 8)

g

12

g

12

mVV (max)

Quiescent Current

a

120

120

m

A (max)

(Note 9)

a

160

160

m

A (max)

Change of Quiescent

20

20

m

A (max)

Current (Note 8)

Temperature Coefficient

a

20

a

20

m

A C

of Quiescent Current

Minimum Temperature

In circuit of

a

25

a

25

C (min)

for Rated Accuracy

Long Term Stability (Note 10)

g

012

g

012

C

Note 1

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when operating

the device beyond its rated operating conditions

Note 2

See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National

Semiconductor Linear Data Book for other methods of soldering surface mount devices

Note 3

Human body model 100 pF discharged through a 15 kX resistor Machine model 200 pF discharged directly into each pin

Note 4

Thermal resistance of the SOT-23 package is 260 CW junction to ambient when attached to a printed circuit board with 2 oz foil as shown in

Figure 3

Note 5

Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)

Note 6

Accuracy is defined as the error between the output voltage and 10 mv C times the device’s case temperature at specified conditions of voltage current

and temperature (expressed in C)

Note 7

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature

range

Note 8

Regulation is measured at constant junction temperature using pulse testing with a low duty cycle Changes in output due to heating effects can be

computed by multiplying the internal dissipation by the thermal resistance

Note 9

Quiescent current is measured using the circuit of

Figure 1

Note 10

For best long-term stability any precision circuit will give best results if the unit is aged at a warm temperature andor temperature cycled for at least 46

hours before long-term life test begins This is especially true when a small (Surface-Mount) part is wave-soldered allow time for stress relaxation to occur

2