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MC74AC373DTR2G 数据表(PDF) 3 Page - ON Semiconductor

部件名 MC74AC373DTR2G
功能描述  Octal Transparent Latch with 3-State Outputs
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制造商  ONSEMI [ON Semiconductor]
网页  http://www.onsemi.com
标志 ONSEMI - ON Semiconductor

MC74AC373DTR2G 数据表(HTML) 3 Page - ON Semiconductor

  MC74AC373DTR2G Datasheet HTML 1Page - ON Semiconductor MC74AC373DTR2G Datasheet HTML 2Page - ON Semiconductor MC74AC373DTR2G Datasheet HTML 3Page - ON Semiconductor MC74AC373DTR2G Datasheet HTML 4Page - ON Semiconductor MC74AC373DTR2G Datasheet HTML 5Page - ON Semiconductor MC74AC373DTR2G Datasheet HTML 6Page - ON Semiconductor MC74AC373DTR2G Datasheet HTML 7Page - ON Semiconductor MC74AC373DTR2G Datasheet HTML 8Page - ON Semiconductor MC74AC373DTR2G Datasheet HTML 9Page - ON Semiconductor Next Button
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MC74AC373, MC74ACT373
www.onsemi.com
3
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage (Referenced to GND)
−0.5 to +7.0
V
VIN
DC Input Voltage (Referenced to GND)
−0.5 to VCC +0.5
V
VOUT
DC Output Voltage (Referenced to GND) (Note 1)
−0.5 to VCC +0.5
V
IIK
DC Input Diode Current
±20
mA
IOK
DC Output Diode Current
±50
mA
IOUT
DC Output Sink/Source Current
±50
mA
ICC
DC Supply Current, per Output Pin
±50
mA
IGND
DC Ground Current, per Output Pin
±100
mA
TSTG
Storage Temperature Range
*65 to )150
_C
TL
Lead temperature, 1 mm from Case for 10 Seconds
260
_C
TJ
Junction Temperature Under Bias
140
_C
qJA
Thermal Resistance (Note 2)
SOIC
TSSOP
65.8
110.7
_C/W
MSL
Moisture Sensitivity
Level 1
FR
Flammability Rating
Oxygen Index: 30% − 35%
UL 94 V−0 @ 0.125 in
VESD
ESD Withstand Voltage
Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
> 2000
> 200
> 1000
V
ILatchup
Latchup Performance
Above VCC and Below GND at 85_C (Note 6)
±100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IOUT absolute maximum rating must be observed.
2. The package thermal impedance is calculated in accordance with JESD 51−7.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Supply Voltage
′AC
2.0
5.0
6.0
V
′ACT
4.5
5.0
5.5
VIN, VOUT
DC Input Voltage, Output Voltage (Ref. to GND)
0
VCC
V
tr, tf
Input Rise and Fall Time (Note 7)
′AC Devices except Schmitt Inputs
VCC @ 3.0 V
150
VCC @ 4.5 V
40
ns/V
VCC @ 5.5 V
25
tr, tf
Input Rise and Fall Time (Note 8)
′ACT Devices except Schmitt Inputs
VCC @ 4.5 V
10
ns/V
VCC @ 5.5 V
8.0
TA
Operating Ambient Temperature Range
−40
25
85
°C
IOH
Output Current − High
−24
mA
IOL
Output Current − Low
24
mA
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
7. VIN from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
8. VIN from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.


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