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EPM7256AE 数据表(PDF) 23 Page - Altera Corporation

部件名 EPM7256AE
功能描述  Programmable Logic Device
Download  60 Pages
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制造商  ALTERA [Altera Corporation]
网页  http://www.altera.com
标志 ALTERA - Altera Corporation

EPM7256AE 数据表(HTML) 23 Page - Altera Corporation

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Altera Corporation
23
MAX 7000A Programmable Logic Device Data Sheet
Power
Sequencing &
Hot-Socketing
Because MAX 7000A devices can be used in a mixed-voltage environment,
they have been designed specifically to tolerate any possible power-up
sequence. The VCCIO and VCCINT power planes can be powered in any
order.
Signals can be driven into MAX 7000AE devices before and during power-
up (and power-down) without damaging the device. Additionally,
MAX 7000AE devices do not drive out during power-up. Once operating
conditions are reached, MAX 7000AE devices operate as specified by the
user.
Design Security
All MAX 7000A devices contain a programmable security bit that controls
access to the data programmed into the device. When this bit is
programmed, a design implemented in the device cannot be copied or
retrieved. This feature provides a high level of design security because
programmed data within EEPROM cells is invisible. The security bit that
controls this function, as well as all other programmed data, is reset only
when the device is reprogrammed.
Generic Testing
MAX 7000A devices are fully tested. Complete testing of each
programmable EEPROM bit and all internal logic elements ensures 100%
programming yield. AC test measurements are taken under conditions
equivalent to those shown in Figure 9. Test patterns can be used and then
erased during early stages of the production flow.
Figure 9. MAX 7000A AC Test Conditions
VCC
To Test
System
C1 (includes jig
capacitance)
Device input
rise and fall
times < 2 ns
Device
Output
703
[521
Ω]
586
[481
Ω]
Power supply transients can affect AC
measurements. Simultaneous transitions
of multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast-ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients flow
through the parasitic inductance between
the device ground pin and the test system
ground, significant reductions in
observable noise immunity can result.
Numbers in brackets are for 2.5-V
outputs. Numbers without brackets are for
3.3-V outputs.


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