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EPM7256AE 数据表(PDF) 23 Page - Altera Corporation |
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EPM7256AE 数据表(HTML) 23 Page - Altera Corporation |
23 / 60 page Altera Corporation 23 MAX 7000A Programmable Logic Device Data Sheet Power Sequencing & Hot-Socketing Because MAX 7000A devices can be used in a mixed-voltage environment, they have been designed specifically to tolerate any possible power-up sequence. The VCCIO and VCCINT power planes can be powered in any order. Signals can be driven into MAX 7000AE devices before and during power- up (and power-down) without damaging the device. Additionally, MAX 7000AE devices do not drive out during power-up. Once operating conditions are reached, MAX 7000AE devices operate as specified by the user. Design Security All MAX 7000A devices contain a programmable security bit that controls access to the data programmed into the device. When this bit is programmed, a design implemented in the device cannot be copied or retrieved. This feature provides a high level of design security because programmed data within EEPROM cells is invisible. The security bit that controls this function, as well as all other programmed data, is reset only when the device is reprogrammed. Generic Testing MAX 7000A devices are fully tested. Complete testing of each programmable EEPROM bit and all internal logic elements ensures 100% programming yield. AC test measurements are taken under conditions equivalent to those shown in Figure 9. Test patterns can be used and then erased during early stages of the production flow. Figure 9. MAX 7000A AC Test Conditions VCC To Test System C1 (includes jig capacitance) Device input rise and fall times < 2 ns Device Output 703 Ω [521 Ω] 586 Ω [481 Ω] Power supply transients can affect AC measurements. Simultaneous transitions of multiple outputs should be avoided for accurate measurement. Threshold tests must not be performed under AC conditions. Large-amplitude, fast-ground- current transients normally occur as the device outputs discharge the load capacitances. When these transients flow through the parasitic inductance between the device ground pin and the test system ground, significant reductions in observable noise immunity can result. Numbers in brackets are for 2.5-V outputs. Numbers without brackets are for 3.3-V outputs. |
类似零件编号 - EPM7256AE |
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类似说明 - EPM7256AE |
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