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LM2705MF-ADJ 数据表(PDF) 3 Page - Texas Instruments

部件名 LM2705MF-ADJ
功能描述  LM2705 Micropower Step-up DC/DC Converter with 150mA Peak Current Limit
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

LM2705MF-ADJ 数据表(HTML) 3 Page - Texas Instruments

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LM2705
www.ti.com
SNVS191E – NOVEMBER 2002 – REVISED MAY 2013
Absolute Maximum Ratings
(1) (2)
VIN
7.5V
SW Voltage
21V
FB Voltage
2V
SHDN Voltage
7.5V
Maximum Junction Temp. TJ
(3)
150°C
Lead Temperature
(Soldering 10 sec.)
300°C
Vapor Phase
(60 sec.)
215°C
Infrared
(15 sec.)
220°C
ESD Ratings (4)
Human Body Model
2kV
Machine Model (5)
200V
(1)
Absolute maximum ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the
device is intended to be functional. For specifications and test conditions, see the Electrical Characteristics.
(2)
If Military/Aerospace specified devices are required, please contact the TI Sales Office/Distributors for availability and specifications.
(3)
The maximum allowable power dissipation is a function of the maximum junction temperature, TJ(MAX), the junction-to-ambient thermal
resistance,
θJA, and the ambient temperature, TA. See the Electrical Characteristics table for the thermal resistance. The maximum
allowable power dissipation at any ambient temperature is calculated using: PD (MAX) = (TJ(MAX) − TA)/θJA. Exceeding the maximum
allowable power dissipation will cause excessive die temperature.
(4)
The human body model is a 100 pF capacitor discharged through a 1.5 k
Ω resistor into each pin. The machine model is a 200 pF
capacitor discharged directly into each pin.
(5)
ESD susceptibility using the machine model is 150V for SW pin.
Operating Conditions
Junction Temperature
(1)
−40°C to +125°C
Supply Voltage
2.2V to 7V
SW Voltage Max.
20.5V
(1)
All limits specified at room temperature and at temperature extremes. All room temperature limits are 100% production tested or
specified through statistical analysis. All limits at temperature extremes are specified via correlation using standard Statistical Quality
Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL).
Copyright © 2002–2013, Texas Instruments Incorporated
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