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MC-80C32E-30-E 数据表(PDF) 10 Page - ATMEL Corporation |
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MC-80C32E-30-E 数据表(HTML) 10 Page - ATMEL Corporation |
10 / 20 page 10 80C32E 4149M–AERO–06/04 If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test conditions. 6. Operating ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns, VIL = VSS + 0.5V, V IH = VCC - 0.5V; XTAL2 N.C.; EA = Port 0 = VCC; RST = VSS. The internal ROM runs the code 80 FE (label: SJMP label). ICC would be slightly higher if a crystal oscillator is used. Measurements are made with OTP products when possible, which is the worst case. Figure 2. ICC Test Condition, Under Reset Figure 3. Operating ICC Test Condition Figure 4. ICC Test Condition, Idle Mode EA VCC VCC ICC (NC) CLOCK SIGNAL VCC All other pins are disconnected. RST XTAL2 XTAL1 VSS VCC P0 EA VCC VCC ICC (NC) CLOCK SIGNAL All other pins are disconnected. RST XTAL2 XTAL1 V SS V CC P0 Reset = Vss after a high pulse during at least 24 clock cycles RST EA XTAL2 XTAL1 V SS VCC VCC ICC (NC) P0 VCC All other pins are disconnected. CLOCK SIGNAL Reset = Vss after a high pulse during at least 24 clock cycles |
类似零件编号 - MC-80C32E-30-E |
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类似说明 - MC-80C32E-30-E |
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