DAC128S085CIMT datasheet(6/35 Pages) TI1

部件名	DAC128S085CIMT

功能描述	12-Bit Micro-Power OCTAL Digital-to-Analog Converter With Rail-to-Rail Outputs

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制造商	TI1 [Texas Instruments]

网页	http://www.ti.com

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6 / 35 page

DAC128S085

SNAS407H – AUGUST 2007 – REVISED APRIL 2015

www.ti.com

7.4 Thermal Information

DAC128S085

THERMAL METRIC(1)

PW (TSSOP)

RGH (WQFN)

UNIT

16 PINS

RθJA

Junction-to-ambient thermal resistance

98

34

RθJA

Junction-to-ambient thermal resistance

31

25

RθJA

Junction-to-ambient thermal resistance

43

11

°C/W

φJT

Junction-to-top characterization parameter

2

0.2

φJB

Junction-to-board characterization parameter

43

11

(1)

For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.

7.5 Electrical Characteristics

The following specifications apply for VA = 2.7 V to 5.5 V, VREF1 = VREF2 = VA, CL = 200 pF to GND, fSCLK = 30 MHz, input

code range 48 to 4047. All limits are at TA = 25°C, unless otherwise specified.

PARAMETER

TEST CONDITIONS

MIN(1)

TYP

MAX(1)

UNIT

STATIC PERFORMANCE

Resolution

TMIN ≤ TA ≤ TMAX

12

Bits

Monotonicity

TMIN ≤ TA ≤ TMAX

12

Bits

±2

INL

Integral Non-Linearity

LSB

TMIN ≤ TA ≤ TMAX

±8

0.15

LSB

TMIN ≤ TA ≤ TMAX

0.75

DNL

Differential Non-Linearity

−0.09

LSB

TMIN ≤ TA ≤ TMAX

−0.4

IOUT = 0

+5

ZE

Zero Code Error

mV

TMIN ≤ TA ≤ TMAX

15

IOUT = 0

−0.1%

FSE

Full-Scale Error

FSR

TMIN ≤ TA ≤ TMAX

−0.75%

−0.2%

GE

Gain Error

FSR

TMIN ≤ TA ≤ TMAX

−1 %

ZCED

Zero Code Error Drift

−20

µV/°C

TC GE

Gain Error Tempco

−1

ppm/°C

OUTPUT CHARACTERISTICS

Output Voltage Range

TMIN ≤ TA ≤ TMAX

0

VREF1,2

V

High-Impedance Output

IOZ

TMIN ≤ TA ≤ TMAX

±1

µA

Leakage Current(2)

VA = 3 V, IOUT = 200 µA

10

mV

VA = 3 V, IOUT = 1 mA

45

mV

ZCO

Zero Code Output

VA = 5 V, IOUT = 200 µA

8

mV

VA = 5 V, IOUT = 1 mA

34

mV

VA = 3 V, IOUT = 200 µA

2.984

V

VA = 3 V, IOUT = 1 mA

2.933

V

FSO

Full Scale Output

VA = 5 V, IOUT = 200 µA

4.987

V

VA = 5 V, IOUT = 1 mA

4.955

V

(1)

Test limits are ensured to TI's AOQL (Average Outgoing Quality Level).

(2)

This parameter is ensured by design and/or characterization and is not tested in production.

6

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