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ADC08062CIWM 数据表(PDF) 10 Page - National Semiconductor (TI) |
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ADC08062CIWM 数据表(HTML) 10 Page - National Semiconductor (TI) |
10 / 16 page Timing Diagrams (Continued) Typical Performance Characteristics Application Information 1.0 FUNCTIONAL DESCRIPTION The ADC08061 and ADC08062 perform an 8-bit analog-to-digital conversion using a multi-step flash tech- nique. The first flash generates the five most significant bits (MSBs) and the second flash generates the three least sig- nificant bits (LSBs). Figure 6 shows the major functional blocks of the ADC08061/2’s multi-step flash converter. It consists of an over-encoded 21⁄2-bit Voltage Estimator, an in- ternal DAC with two different voltage spans, a 3-bit half-flash converter and a comparator multiplexer. The resistor string near the center of the block diagram in Figure 6 forms the internal main DAC. Each of the eight re- sistors at the bottom of the string is equal to 1/256 of the total string resistance. These resistors form the LSB Ladder and DS011086-10 FIGURE 5. RD Mode (Pipeline Operation) (Mode Pin is Low and t RDW must be between 200 ns and 400 ns) t CRD vs Temperature DS011086-25 Linearity Error vs Reference Voltage DS011086-26 Offset Error vs Reference Voltage DS011086-27 Supply Current vs Temperature DS011086-28 Logic Threshold vs Temperature DS011086-29 Output Current vs Temperature DS011086-30 www.national.com 10 |
类似零件编号 - ADC08062CIWM |
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类似说明 - ADC08062CIWM |
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