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54ACTQ10D 数据表(PDF) 3 Page - National Semiconductor (TI) |
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54ACTQ10D 数据表(HTML) 3 Page - National Semiconductor (TI) |
3 / 5 page DC Characteristics for ’ACTQ Family Devices (Continued) 54ACTQ Symbol Parameter V CC T A = Units Conditions (V) −55˚C to +125˚C Guaranteed Limits V OLP Quiet Output 5.0 1.5 V Maximum Dynamic V OL (Note 6) V OLV Quiet Output 5.0 -1.2 V Minimum Dynamic V OL (Note 6) Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: ICC for 54ACTQ @ 25˚C is identical to 74ACTQ @ 25˚C. Note 6: Max number of outputs defined as (n). Data inputs are 0V to 3V. One output @ GND. Note 7: Max number of data inputs (n) switching. (n-1) inputs switching 0V to 3V (’ACTQ). Input-under-test switching: 3V to threshold (V ILD), 0V to threshold (VIHD), f = 1 MHZ. AC Electrical Characteristics 54ACTQ V CC T A = −55˚C Symbol Parameter (V) (Note 8) to +125˚C Units C L = 50 pF Min Max t PLH Propagation Delay 5.0 2.0 9.5 ns t PHL Propagation Delay 5.0 2.0 9.5 ns Note 8: Voltage Range 5.0 is 5.0V ±0.5V. Capacitance Symbol Parameter Typ Units Conditions C IN Input Capacitance 4.5 pF V CC = OPEN C PD Power Dissipation 85 pF V CC = 5.0V Capacitance www.national.com 3 |
类似零件编号 - 54ACTQ10D |
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类似说明 - 54ACTQ10D |
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