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LB11946 数据表(PDF) 1 Page - ON Semiconductor

部件名 LB11946
功能描述  Stepping Motor Driver
Download  14 Pages
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制造商  ONSEMI [ON Semiconductor]
网页  http://www.onsemi.com
标志 ONSEMI - ON Semiconductor

LB11946 数据表(HTML) 1 Page - ON Semiconductor

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22509 MS 20090212-S00006 / N2206 / 73004TN(OT) No.7946-1/14
http://onsemi.com
Semiconductor Components Industries, LLC, 2013
June, 2013
LB11946
Overview
The LB11946 is a stepping motor driver IC that implements PWM current control bipolar drive with a fixed off time.
This IC features 15 current setting levels using a fixed VREF voltage and support for micro-stepping drive from 1-2
phase excitation drive to 4W1-2 phase excitation drive. This device is optimal for driving stepping motors such as
those used for carriage drive and paper feed in printers.
Features
• PWM current control (with a fixed off time)
• Logic input serial-parallel converter (allows 1-2, W1-2, 2W1-2, and 4W1-2 phase excitation drive)
• Current attenuation switching function (with slow decay, fast decay, and mixed decay modes)
• Built-in upper and lower side diodes
• Simultaneous on state prevention function (through current prevention)
• Noise canceller function
• Thermal shutdown circuit
• Shutoff on low logic system voltage circuit
• Low-power mode control pin
Specifications
Maximum Ratings at Ta = 25
°C
Parameter
Symbol
Conditions
Ratings
Unit
Motor supply voltage
VBB
50
V
Peak output current
IO peak
tw
≤ 20μS
1.2
A
Continuous output current
IO max
1.0
A
Logic system supply voltage
VCC
7.0
V
Logic input voltage range
VIN
-0.3 to VCC
V
VCC = 5V specifications
1.0
V
Emitter output voltage
VE
VCC = 3.3V specifications
0.5
V
Allowable power dissipation
Pd max
Independent IC
3.0
W
Operating temperature
Topr
-25 to
+85
°C
Storage temperature
Tstg
-55 to
+150
°C
Monolithic Digital IC
PWM Current Control
Stepping Motor Driver
Ordering number : EN7946A
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.


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