LM2717-ADJ

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SNVS407C – DECEMBER 2005 – REVISED MARCH 2013

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1)

−0.3V to 22V

SW1 Voltage

−0.3V to 22V

SW2 Voltage

−0.3V to 22V

FB1, FB2 Voltages

−0.3V to 7V

CB1, CB2 Voltages

1.75V

0.965V

SHDN1 Voltage

−0.3V to 7.5V

SHDN2 Voltage

−0.3V to 7.5V

SS1 Voltage

−0.3V to 2.1V

SS2 Voltage

−0.3V to 2.1V

FSLCT Voltage

AGND to 5V

Maximum Junction Temperature

150°C

Internally Limited

Lead Temperature

300°C

Vapor Phase (60 sec.)

215°C

Infrared (15 sec.)

220°C

Human Body Model

2kV

(1)

Absolute maximum ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the

device is intended to be functional, but device parameter specifications may not be ensured. For ensured specifications and test

conditions, see the Electrical Characteristics table.

(2)

resistance,

allowable power dissipation will cause excessive die temperature, and the regulator will go into thermal shutdown.

(3)

The human body model is a 100 pF capacitor discharged through a 1.5k

Ω resistor into each pin.

Operating Conditions

Operating Junction Temperature Range

(1)

−40°C to +125°C

Storage Temperature

−65°C to +150°C

Supply Voltage

4V to 20V

SW1 Voltage

20V

SW2 Voltage

20V

Switching Frequency

300kHz to 600kHz

(1)

All limits specified at room temperature (standard typeface) and at temperature extremes (bold typeface). All room temperature limits are

100% tested or specified through statistical analysis. All limits at temperature extremes are specified via correlation using standard

Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL).

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