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LT1128CS8 数据表(PDF) 12 Page - Linear Technology |
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LT1128CS8 数据表(HTML) 12 Page - Linear Technology |
12 / 20 page 12 LT1028/LT1128 Noise Testing – Current Noise Current noise density (In) is defined by the following formula, and can be measured in the circuit shown: If the Quan Tech Model 5173 is used, the noise reading is input-referred, therefore the result should not be divided by 31; the resistor noise should not be multiplied by 31. 100% Noise Testing The 1kHz voltage and current noise is 100% tested on the LT1028/LT1128 as part of automated testing; the approxi- mate frequency response of the filters is shown. The limits on the automated testing are established by extensive correlation tests on units measured with the Quan Tech Model 5173. S APPLICATI I FOR ATIO 10Hz voltage noise density is sample tested on every lot. Devices 100% tested at 10Hz are available on request for an additional charge. 10Hz current noise is not tested on every lot but it can be inferred from 100% testing at 1kHz. A look at the current noise spectrum plot will substantiate this statement. The only way 10Hz current noise can exceed the guaranteed limits is if its 1/f corner is higher than 800Hz and/or its white noise is high. If that is the case then the 1kHz test will fail. In = [eno 2 – (31 × 18.4nV/√Hz)2]1/2 20k × 31 – + eno 1.8k 60 Ω LT1028 LT1128 10k 10k 1028/1128 AI04 – OISE FREQUENCY (Hz) 100 –50 –10 0 10 1k 10k 100k LT1028/1128 • AI05 –20 –40 –30 CURRENT NOISE VOLTAGE NOISE S APPLICATI I FOR ATIO General The LT1028/LT1128 series devices may be inserted di- rectly into OP-07, OP-27, OP-37, LT1007 and LT1037 sockets with or without removal of external nulling com- ponents. In addition, the LT1028/LT1128 may be fitted to 5534 sockets with the removal of external compensation components. Offset Voltage Adjustment The input offset voltage of the LT1028/LT1128 and its drift with temperature, are permanently trimmed at wafer test- ing to a low level. However, if further adjustment of VOS is necessary, the use of a 1k nulling potentiometer will not degrade drift with temperature. Trimming to a value other Automated Tester Noise Filter – + 6 1k INPUT LT1028 LT1128 1028/1128 AI06 7 8 1 2 3 4 OUTPUT –15V 15V than zero creates a drift of (VOS/300)µV/°C, e.g., if VOS is adjusted to 300 µV, the change in drift will be 1µV/°C. The adjustment range with a 1k pot is approximately ±1.1mV. Offset Voltage and Drift Thermocouple effects, caused by temperature gradients across dissimilar metals at the contacts to the input |
类似零件编号 - LT1128CS8 |
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类似说明 - LT1128CS8 |
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