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DA28F016SV-080 数据表(PDF) 27 Page - Intel Corporation |
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DA28F016SV-080 数据表(HTML) 27 Page - Intel Corporation |
27 / 63 page E 28F016SV FlashFile™ MEMORY 27 TEST POINTS INPUT OUTPUT 2.0 0.8 0.8 2.0 2.4 0.45 AC test inputs are driven at V OH (2.4 VTTL) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at VIH (2.0 VTTL) and V IL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) <10 ns. 0528_07 Figure 7. Transient Input/Output Reference Waveform for VCC = 5V ± 10% (Standard Testing Configuration)(1) TEST POINTS INPUT OUTPUT 1.5 3.0 0.0 1.5 AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V. Input rise and fall times (10% to 90%) <10 ns. 0528_08 Figure 8. Transient Input/Output Reference Waveform for VCC = 3.3V ± 0.3V and VCC = 5V ± 5% (High Speed Testing Configuration)(2) NOTES: 1. Testing characteristics for 28F016SV-070 (Standard Testing Configuration) and 28F016SV-080. 2. Testing characteristics for 28F016SV-065/28F016SV-075 and 28F016SV-70 (High Speed Testing Configuration)/ 28F016SV-120. |
类似零件编号 - DA28F016SV-080 |
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类似说明 - DA28F016SV-080 |
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