LF412-N

www.ti.com

SNOSBH7E – APRIL 1999 – REVISED MARCH 2013

LF412 Low Offset, Low Drift Dual JFET Input Operational Amplifier

Check for Samples: LF412-N

1

FEATURES

DESCRIPTION

These devices are low cost, high speed, JFET input

23

•

Internally Trimmed Offset Voltage: 1 mV (max)

operational amplifiers with very low input offset

•

Input Offset Voltage Drift: 10 µV/°C (max)

voltage and guaranteed input offset voltage drift.

•

Low Input Bias Current: 50 pA

They require low supply current yet maintain a large

gain bandwidth product and fast slew rate. In

•

Low Input Noise Current: 0.01 pA /

√Hz

addition, well matched high voltage JFET input

•

Wide Gain Bandwidth: 3 MHz (min)

devices provide very low input bias and offset

•

High Slew Rate: 10V/µs (min)

currents. The LF412 dual is pin compatible with the

LM1558, allowing designers to immediately upgrade

•

Low Supply Current: 1.8 mA/Amplifier

the overall performance of existing designs.

•

Ω

These amplifiers may be used in applications such as

•

Low Total Harmonic Distortion:

≤0.02%

high speed integrators, fast D/A converters, sample

•

Low 1/f Noise Corner: 50 Hz

and hold circuits and many other circuits requiring low

•

Fast Settling Time to 0.01%: 2 µs

input offset voltage and drift, low input bias current,

high input impedance, high slew rate and wide

bandwidth.

Typical Connection

Figure 1.

Connection Diagram

Figure 2. TO Package – Top View

See Package Number NEV0008A

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

BI-FET II is a trademark of Texas Instruments.

3

All other trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 1999–2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.