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AM27C040-90JI 数据表(PDF) 9 Page - Advanced Micro Devices |
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AM27C040-90JI 数据表(HTML) 9 Page - Advanced Micro Devices |
9 / 13 page Am27C040 9 FI NAL TEST CONDITIONS Table 1. Test Specifications SWITCHING TEST WAVEFORM KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 5.0 V Device Under Test 14971G-5 Figure 1. Test Setup Note: Diodes are IN3064 or equivalents. Test Condition All Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 100 pF Input Rise and Fall Times ≤ 20 ns Input Pulse Levels 0.45–2.4 V Input timing measurement reference levels 0.8, 2.0 V Output timing measurement reference levels 0.8, 2.0 V 2.4 V 0.45 V Input Output Test Points 2.0 V 2.0 V 0.8 V 0.8 V 14971G-6 3 V 0 V Input Output 1.5 V 1.5 V Test Points Note: For CL = 100 pF. Note: For CL = 30 pF. KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) |
类似零件编号 - AM27C040-90JI |
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类似说明 - AM27C040-90JI |
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