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06031C332KAT2A Datasheet(数据表) 2 Page - AVX Corporation

部件型号  06031C332KAT2A
说明  X7R Dielectric General Specifications
下载  4 Pages
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制造商  AVX [AVX Corporation]
网页  http://www.avx.com
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06031C332KAT2A Datasheet(HTML) 2 Page - AVX Corporation

   
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18
X7R Dielectric
Specifications and Test Methods
Parameter/Test
X7R Specification Limits
Measuring Conditions
Operating Temperature Range
-55ºC to +125ºC
Temperature Cycle Chamber
Capacitance
Within specified tolerance
≤ 2.5% for ≥ 50V DC rating
Freq.: 1.0 kHz ± 10%
Dissipation Factor
≤ 3.0% for 25V DC rating
Voltage: 1.0Vrms ± .2V
≤ 3.5% for 25V and 16V DC rating
≤ 5.0% for ≤ 10V DC rating
Insulation Resistance
100,000MΩ or 1000MΩ - μF,
Charge device with rated voltage for
whichever is less
120 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
Dielectric Strength
No breakdown or visual defects
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Appearance
No defects
Deflection: 2mm
Capacitance
Test Time: 30 seconds
Resistance to
Variation
≤ ±12%
Flexure
Dissipation
Meets Initial Values (As Above)
Stresses
Factor
Insulation
≥ Initial Value x 0.3
Resistance
Solderability
≥ 95% of each terminal should be covered
Dip device in eutectic solder at 230 ± 5ºC
with fresh solder
for 5.0 ± 0.5 seconds
Appearance
No defects, <25% leaching of either end terminal
Capacitance
Variation
≤ ±7.5%
Dip device in eutectic solder at 260ºC for 60
Dissipation
Meets Initial Values (As Above)
seconds. Store at room temperature for 24 ± 2
Resistance to
Factor
hours before measuring electrical properties.
Solder Heat
Insulation
Meets Initial Values (As Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Appearance
No visual defects
Step 1: -55ºC ± 2º
30 ± 3 minutes
Capacitance
Variation
≤ ±7.5%
Step 2: Room Temp
≤ 3 minutes
Dissipation
Meets Initial Values (As Above)
Step 3: +125ºC ± 2º
30 ± 3 minutes
Thermal
Factor
Shock
Insulation
Meets Initial Values (As Above)
Step 4: Room Temp
≤ 3 minutes
Resistance
Dielectric
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after
Strength
24 ± 2 hours at room temperature
Appearance
No visual defects
Capacitance
Variation
≤ ±12.5%
Dissipation
≤ Initial Value x 2.0 (See Above)
Load Life
Factor
Insulation
≥ Initial Value x 0.3 (See Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Appearance
No visual defects
Capacitance
Variation
≤ ±12.5%
Load
Dissipation
≤ Initial Value x 2.0 (See Above)
Humidity
Factor
Insulation
≥ Initial Value x 0.3 (See Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Charge device with 1.5 rated voltage (≤ 10V) in
test chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0)
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
1mm/sec
90 mm




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