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74HCT32BQ 数据表(PDF) 8 Page - NXP Semiconductors |
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74HCT32BQ 数据表(HTML) 8 Page - NXP Semiconductors |
8 / 17 page 74HC_HCT32 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 5 — 4 September 2012 8 of 17 NXP Semiconductors 74HC32; 74HCT32 Quad 2-input OR gate Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 7. Load circuitry for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74HC32 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HCT32 3.0 V 6.0 ns 15 pF, 50 pF tPLH, tPHL |
类似零件编号 - 74HCT32BQ |
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类似说明 - 74HCT32BQ |
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