 |
数据搜索系统，热门电子元器件搜索 |
|
|
数据搜索系统，热门电子元器件搜索 |
|
ISL9N307AP3 Datasheet(数据表) 6 Page - Fairchild Semiconductor |
|
||||||||||||||||||||||||||||||
ISL9N307AP3 Datasheet(HTML) 6 Page - Fairchild Semiconductor |
|
|
6 page 
©2002 Fairchild Semiconductor Corporation Rev. B, January 2002 Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms Test Circuits and Waveforms (Continued) RL VGS + - VDS VDD DUT Ig(REF) VDD Qg(TH) VGS = 1V Qg(5) VGS = 5V Qg(TOT) VGS = 10V VDS VGS Ig(REF) 0 0 Qgs Qgd VGS RL RGS DUT + - VDD VDS VGS tON td(ON) tr 90% 10% VDS 90% 10% tf td(OFF) tOFF 90% 50% 50% 10% PULSE WIDTH VGS 0 0 |
Chinese▼
English
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
