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SN74ALS09DE4 数据表(PDF) 1 Page - Texas Instruments

部件名 SN74ALS09DE4
功能描述  QUADRUPLE 2-INPUT POSITIVE-AND GATES WITH OPEN-COLLECTOR OUTPUTS
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

SN74ALS09DE4 数据表(HTML) 1 Page - Texas Instruments

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SN54ALS09, SN74ALS09
QUADRUPLE 2-INPUT POSITIVE-AND GATES
WITH OPEN-COLLECTOR OUTPUTS
SDAS084B – APRIL 1982 – REVISED DECEMBER 1994
Copyright
© 1994, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Package Options Include Plastic
Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These devices contain four independent 2-input
positive-AND gates. They perform the Boolean
functions Y = A
• B or Y = A + B in positive logic.
The
open-collector
outputs
require
pullup
resistors to perform correctly. These outputs may
be connected to other open-collector outputs to
implement active-low wired-OR or active-high
wired-AND functions. Open-collector devices are
often used to generate higher VOH levels.
The SN54ALS09 is characterized for operation
over the full military temperature range of – 55
°C
to 125
°C. The SN74ALS09 is characterized for
operation from 0
°C to 70°C.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
Y
H
H
H
L
XL
X
L
L
logic symbol
logic diagram (positive logic)
1
1A
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
&
1Y
3
2Y
6
3Y
8
4Y
11
1
1A
2
1B
1Y
3
4
2A
5
2B
2Y
6
9
3A
10
3B
3Y
8
12
4A
13
4B
4Y
11
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
SN54ALS09 ...J PACKAGE
SN74ALS09 ...D OR N PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
VCC
4B
4A
4Y
3B
3A
3Y
SN54ALS09 . . . FK PACKAGE
(TOP VIEW)
3
2
1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
NC – No internal connection
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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