N25Q032A13EF840E datasheet(36/153 Pages) MICRON

部件名	N25Q032A13EF840E

功能描述	32-Mbit 3 V, multiple I/O, 4-Kbyte subsector erase, XiP enabled, serial flash memory with 108 MHz SPI bus interface

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制造商	MICRON [Micron Technology]

网页	http://www.micron.com

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36 / 153 page

Volatile and Non Volatile Registers

N25Q032 - 3 V

36/153

Micron Technology, Inc., reserves the right to change products or specifications without notice.

6.2.1

Dummy clock cycles NV configuration bits (NVCR bits from 15 to 12)

The bits from 15 to 12 of the Non Volatile Configuration register store the default settings for

the dummy clock cycles number after the fast read instructions (in all the 3 available

protocols). The dummy clock cycles number can be set from 1 up to 15 as described here,

according to operating frequency (the higher is the operating frequency, the bigger must be

the dummy clock cycle number) to optimize the fast read instructions performance.

The default values of these bits allow the memory to be safely used with fast read

instructions at the maximum frequency (108 MHz). Please note that if the dummy clock

number is not sufficient for the operating frequency, the memory reads wrong data.

Table 4.

Maximum operative frequency by dummy clock cycles

NVCR<5>

Reserved

x

Don’t Care

Default value = 1

NVCR<4>

Reset/Hold

disable

0

disabled

Disable Pad Hold/Reset functionality

1

enabled (default)

NVCR<3>

Quad Input

Command

0

enabled

Enable command on four input lines

1

disabled (default)

NVCR<2>

Dual Input

Command

0

enabled

Enable command on two input lines

1

disabled (default)

NVCR<1:0>

Reserved

xx

Don't care

Default value = "11"

Table 3.

Non-Volatile Configuration Register

Bit

Parameter

Value

Description

Note

Maximum allowed frequency (MHz) (1)

Dummy Clock

FASTREAD

DOFR

DIOFR

QOFR

QIOFR

1

54

503943

20

2

95

855956

39

3

105

95

75

70

49

4

108

105

88

83

59

5

108

94

69

6

108

105

78

7

108

86

8

108

95

9

108

105

10

108

1. All the values are guaranteed by characterization and not 100% tested in production

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