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AD5241BRZ100 数据表(PDF) 11 Page - Analog Devices |
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AD5241BRZ100 数据表(HTML) 11 Page - Analog Devices |
11 / 20 page AD5241/AD5242 Rev. C | Page 11 of 20 TEST CIRCUITS Figure 22 to Figure 30 define the test conditions used in the product specifications table. VMS A W B DUT V+ V+ = VDD 1 LSB = V+/2N Figure 22. Potentiometer Divider Nonlinearity Error (INL, DNL) NO CONNECT IW VMS A W B DUT Figure 23. Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) VMS1 IW = VDD/RNOMINAL VMS2 VW A W B DUT RW = [VMS1 – VMS2]/IW Figure 24. Wiper Resistance Δ VDD% Δ VMS% PSS (%/%) = V+ = VDD ±10% PSRR (dB) = 20 LOG VDD VA VMS A W B V+ Δ VDD Δ VMS Figure 25. Power Supply Sensitivity (PSS, PSRR) OP279 W 5V B VOUT OFFSET GND OFFSET BIAS A DUT Figure 26. Inverting Gain B A VIN OP279 W 5V VOUT OFFSET GND OFFSET BIAS DUT Figure 27. Noninverting Gain +15V –15V W A 2.5V B VOUT OFFSET GND DUT OP42 VIN Figure 28. Gain vs. Frequency W B DUT ISW CODE = 0x00 RSW = 0.1V ISW 0.1V VSS TO VDD Figure 29. Incremental On Resistance W B VCM ICM A NC GND NC VSS VDD DUT Figure 30. Common-Mode Leakage Current |
类似零件编号 - AD5241BRZ100 |
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类似说明 - AD5241BRZ100 |
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