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ADM202E 数据表(PDF) 9 Page - Analog Devices |
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ADM202E 数据表(HTML) 9 Page - Analog Devices |
9 / 12 page ADM202E/ADM1181A –9– REV. 0 IEC1000-4-3 RADIATED IMMUNITY IEC1000-4-3 (previously IEC801-3) describes the measurement method and defines the levels of immunity to radiated electro- magnetic fields. It was originally intended to simulate the elec- tromagnetic fields generated by portable radio transceivers or any other device which generates continuous wave radiated electromagnetic energy. Its scope has since been broadened to include spurious EM energy which can be radiated from fluores- cent lights, thyristor drives, inductive loads, etc. Testing for immunity involves irradiating the device with an EM field. There are various methods of achieving this including use of anechoic chamber, stripline cell, TEM cell, GTEM cell. A stripline cell consists of two parallel plates with an electric field developed between them. The device under test is placed within the cell and exposed to the electric field. There are three severity levels having field strengths ranging from 1 V to 10 V/m. Results are classified in a similar fashion to those for IEC1000-4-2. 1. Normal Operation. 2. Temporary Degradation or loss of function that is self- recoverable when the interfering signal is removed. 3. Temporary degradation or loss of function that requires operator intervention or system reset when the interfering signal is removed. 4. Degradation or loss of function that is not recoverable due to damage. The ADM202E/ADM1181A products easily meet Classification 1 at the most stringent (Level 3) requirement. In fact field strengths up to 30 V/m showed no performance degradation, and error-free data transmission continued even during irradia- tion. Table III. Test Severity Levels (IEC1000-4-3) Level Field Strength V/m 11 23 310 EMISSIONS/INTERFERENCE EN55 022, CISPR22 defines the permitted limits of radiated and conducted interference from Information Technology (IT) equipment. The objective of the standard is to minimize the level of emissions both conducted and radiated. For ease of measurement and analysis, conducted emissions are assumed to predominate below 30 MHz and radiated emissions are assumed to predominate above 30 MHz. CONDUCTED EMISSIONS This is a measure of noise that gets conducted onto the mains power supply. Switching transients from the charge pump that are 20 V in magnitude and contain significant energy can lead to conducted emissions. Other sources of conducted emissions can be due to overlap in switch on-times in the charge pump voltage converter. In the voltage doubler shown below, if S2 has not fully turned off before S4 turns on, this results in a transient current glitch between VCC and GND which results in con- ducted emissions. It is, therefore, important that the switches in the charge pump guarantee break-before-make switching under all conditions so that instantaneous short circuit conditions do not occur. The ADM202E has been designed to minimize the switching transients and ensure break-before-make switching thereby minimizing conducted emissions. This has resulted in the level of emissions being well below the limits required by the specifi- cation. No additional filtering/decoupling other than the recom- mended 0.1 µF capacitor is required. Conducted emissions are measured by monitoring the mains line. The equipment used consists of a LISN (Line Impedance Stabilizing Network) that essentially presents a fixed impedance at RF, and a spectrum analyzer. The spectrum analyzer scans for emissions up to 30 MHz and a plot for the ADM202E is shown in Figure 19. S1 S2 C1 S4 S3 C3 V+ = 2V CC VCC INTERNAL OSCILLATOR GND VCC Figure 17. Charge Pump Voltage Doubler ø1 ø2 SWITCHING GLITCHES Figure 18. Switching Glitches LOG FREQUENCY – MHz 80 70 0 0.3 30 0.6 1 60 50 10 40 30 20 36 10 LIMIT Figure 19. ADM202E Conducted Emissions Plot |
类似零件编号 - ADM202E |
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类似说明 - ADM202E |
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