©2003 Fairchild Semiconductor Corporation

www.fairchildsemi.com

HCPL0XXX Rev. 1.0.4

7

Pulse Gen

CM

V

V

FF

B

A

+-

+5 V

O

V

-

I

F

3

4

+

F

V

-

2

1

Shield

Noise

6

O

5

GND

7

8

V

B

V

CC

V

L

R

PLH

OL

V

0

5 V

1.5 V

F

I

1.5 V

T

PHL

T

Switch at A : I = 0 mA

F

Switch at A : I = 16 mA

F

O

V

OL

V

5 V

0 V

10%

10%

90%

CM

V

10 V

4

5

Noise

1

2

3

Shield

8

7

6

+5 V

O

V

GND

-

+

F2

V

-

F

I

+

10% DUTY CYCLE

I/f < 100

µS

F

I

MONITOR

L

R

C = 1.5

µF

L

Pulse

Generator

tr = 5ns

Z = 50

O

GND

+

4

5

1

3

2

-

F2

V

-

Shield

Noise

+5 V

CC

8

V

L

V

6

02

V

7

R

01

V

CM

A

B

Pulse Gen

F

I

+-

+

3

I Monitor

F

4

I/f < 100

µs

10% D.C.

tr = 5ns

Generator

Pulse

Z = 50

O

+

V

F

I

F

-

2

1

Shield

Noise

V

O

O

6

5

GND

7

8

V

B

V

L

R

CC

V

+5 V

0.1

µF

L

C = 1.5

µF

0.1

µF

Test Circuit for HCPL0452, HCPL0453, HCPL0500 and HCPL0501

Test Circuit for HCPL0530, HCPL0531 and HCPL0534

Test Circuit for HCPL0452, HCPL0453, HCPL0500 and HCPL0501

Test Circuit for HCPL0530, HCPL0531 and HCPL0534

f

t

0.1

µF

0.1

µF

FF

V

m

R

m

R

90%

Fig. 8 Common Mode Immunity Test Circuit

Fig. 7 Switching Time Test Circuit