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AD8403ARU100 数据表(PDF) 11 Page - Analog Devices |
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AD8403ARU100 数据表(HTML) 11 Page - Analog Devices |
11 / 20 page Parametric Test Circuits–AD8400/AD8402/AD8403 V+ DUT VMS A B W V+ = VDD 1LSB = V+/256 Figure 29. Potentiometer Divider Nonlinearity Error Test Circuit (INL, DNL) DUT VMS A B W NO CONNECT IW Figure 30. Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) IMS VW2 – [VW1 + IW (RAWII RBW)] IW V+ ≈ V DD WHERE VW1 = VMS WHEN IW = 0 AND VW2 = VMS WHEN IW = 1/R V+ DUT VMS A B W VW IW = 1V/RNOMINAL RW = –––––––––––––––––––––––––– Figure 31. Wiper Resistance Test Circuit PSRR (dB) = 20LOG ( ––––– ) PSS (%/%) = ––––––– ∆V MS ∆V DD ∆V MS% ∆V DD% V+ = VDD ± 10% V+ VMS A B W VDD VA ~ Figure 32. Power Supply Sensitivity Test Circuit (PSS, PSRR) AB VIN 2.5V DC OP279 +5V VOUT ~ DUT W OFFSET GND Figure 33. Inverting Programmable Gain Test Circuit ~ AB VIN 2.5V OP279 +5V VOUT DUT W OFFSET GND Figure 34. Noninverting Programmable Gain Test Circuit ~ B A VIN 2.5V +15V VOUT DUT W –15V OFFSET GND OP42 Figure 35. Gain vs. Frequency Test Circuit DUT ISW B W 0 toVDD RSW = 0.1V ISW CODE = ØØH 0.1V Figure 36. Incremental ON Resistance Test Circuit REV. B –11– |
类似零件编号 - AD8403ARU100 |
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类似说明 - AD8403ARU100 |
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