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MCM69R818AZP7 数据表(PDF) 5 Page - Motorola, Inc

部件名 MCM69R818AZP7
功能描述  4M Late Write HSTL
Download  20 Pages
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制造商  MOTOROLA [Motorola, Inc]
网页  http://www.freescale.com
标志 MOTOROLA - Motorola, Inc

MCM69R818AZP7 数据表(HTML) 5 Page - Motorola, Inc

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MCM69R736A
•MCM69R818A
5
MOTOROLA FAST SRAM
ABSOLUTE MAXIMUM RATINGS (Voltages Referenced to VSS, See Note 1)
Rating
Symbol
Value
Unit
Core Supply Voltage
VDD
– 0.5 to + 4.6
V
Output Supply Voltage
VDDQ
– 0.5 to VDD + 0.5
V
Voltage On Any Pin
Vin
– 0.5 to VDD + 0.5
V
Input Current (per I/O)
Iin
± 50
mA
Output Current (per I/O)
Iout
± 70
mA
Power Dissipation (See Note 2)
PD
W
Operating Temperature
TA
0 to + 70
°C
Temperature Under Bias
Tbias
–10 to + 85
°C
Storage Temperature
Tstg
– 55 to + 125
°C
NOTES:
1. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
exceeded. Functional operation should be restricted to RECOMMENDED OPER-
ATING CONDITIONS. Exposure to higher than recommended voltages for extended
periods of time could affect device reliability.
2. Power dissipation capability will be dependent upon package characteristics and use
environment. See enclosed thermal impedance data.
PBGA PACKAGE THERMAL CHARACTERISTICS
Rating
Symbol
Max
Unit
Notes
Junction to Ambient (Still Air)
R
θJA
53
°C/W
1, 2
Junction to Ambient (@200 ft/min)
Single Layer Board
R
θJA
38
°C/W
1, 2
Junction to Ambient (@200 ft/min)
Four Layer Board
R
θJA
22
°C/W
Junction to Board (Bottom)
R
θJB
14
°C/W
3
Junction to Case (Top)
R
θJC
5
°C/W
4
NOTES:
1. Junction temperature is a function of on–chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient
temperature, air flow, power dissipation of other components on the board, and board thermal resistance.
2. Per SEMI G38–87.
3. Indicates the average thermal resistance between the die and the printed circuit board.
4. Indicates the average thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC–883
Method 1012.1).
CLOCK TRUTH TABLE
K
ZZ
SS
SW
SBa
SBb
SBc
SBd
DQ (n)
DQ (n+1)
Mode
L – H
L
L
H
X
X
X
X
X
Dout 0–35
Read Cycle All Bytes
L – H
L
L
L
L
H
H
H
High–Z
Din 0–8
Write Cycle 1st Byte
L – H
L
L
L
H
L
H
H
High–Z
Din 9–17
Write Cycle 2nd Byte
L – H
L
L
L
H
H
L
H
High–Z
Din 18–26
Write Cycle 3rd Byte
L – H
L
L
L
H
H
H
L
High–Z
Din 27–35
Write Cycle 4th Byte
L – H
L
L
L
L
L
L
L
High–Z
Din 0–35
Write Cycle All Bytes
L – H
L
L
L
H
H
H
H
High–Z
High–Z
Abort Write Cycle
L – H
L
H
H
X
X
X
X
X
High–Z
Deselect Cycle
L – H
L
H
L
X
X
X
X
High–Z
High–Z
Deselect Cycle
X
H
X
X
X
X
X
X
High–Z
High–Z
Sleep Mode
This device contains circuitry to protect the
inputs against damage due to high static volt-
ages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maxi-
mum rated voltages to this high–impedance
circuit.
This BiCMOS memory circuit has been
designed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established.
This device contains circuitry that will ensure
the output devices are in High–Z at power up.


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