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SN74AUP1G79DBVR 数据表(PDF) 1 Page - Texas Instruments

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部件名 SN74AUP1G79DBVR
功能描述  LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP
Download  24 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

SN74AUP1G79DBVR 数据表(HTML) 1 Page - Texas Instruments

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3
2
4
5
1
D
V
CC
Q
CLK
GND
DCK PACKAGE
(TOP VIEW)
3
2
4
5
1
D
V
CC
Q
CLK
GND
DRL PACKAGE
(TOP VIEW)
DBV PACKAGE
(TOP VIEW)
3
2
4
5
1
D
V
CC
Q
CLK
GND
DRY PACKAGE
(TOP VIEW)
CLK
N.C.
D
6
5
4
2
3
GND
Q
V
CC
1
GND
Q
3
4
CLK
2
5
D
6
1
N.C.
V
CC
DSF PACKAGE
(TOP VIEW)
YZP PACKAGE
(TOP VIEW)
GND
D
Q
V
CC
CLK
3
5
2
1
4
A1
B1
C1
A2
C2
YFP PACKAGE
(TOP VIEW)
GND
D
Q
V
CC
CLK
3
6
2
1
4
5
N.C.
A1
B1
C1
A2
B2
C2
SN74AUP1G79
www.ti.com
SCES592G – JULY 2004 – REVISED MAY 2010
LOW-POWER SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP
Check for Samples: SN74AUP1G79
1
FEATURES
Available in the Texas Instruments NanoStar™
Wide Operating VCC Range of 0.8 V to 3.6 V
Package
Optimized for 3.3-V Operation
Low Static-Power Consumption:
3.6-V I/O Tolerant to Support Mixed-Mode
ICC = 0.9 mA Max
Signal Operation
Low Dynamic-Power Consumption:
tpd = 4 ns Max at 3.3 V
Cpd = 3 pF Typ at 3.3 V
Suitable for Point-to-Point Applications
Low Input Capacitance:
Latch-Up Performance Exceeds 100 mA Per
Ci = 1.5 pF Typ
JESD 78, Class II
Low Noise: Overshoot and Undershoot
ESD Performance Tested Per JESD 22
<10% of VCC
2000-V Human-Body Model
Ioff Supports Partial Power-Down-Mode
(A114-B, Class II)
Operation
1000-V Charged-Device Model (C101)
Input Hysteresis Allows Slow Input Transition
and Better Switching Noise Immunity at the
Input (Vhys = 250 mV Typ at 3.3 V)
N.C. – No internal connection
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
The AUP family is TI's premier solution to the industry's low-power needs in battery-powered portable
applications. This family ensures a very low static and dynamic power consumption across the entire VCC range
of 0.8 V to 3.6 V, resulting in an increased battery life. This product also maintains excellent signal integrity (see
Figure 1 and Figure 2).
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2004–2010, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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