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TPA2015D1YZHT 数据表(PDF) 3 Page - Texas Instruments |
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TPA2015D1YZHT 数据表(HTML) 3 Page - Texas Instruments |
3 / 25 page TPA2015D1 www.ti.com SLOS638 – MAY 2010 PIN FUNCTIONS PIN INPUT/ OUTPUT/ DESCRIPTION POWER NAME WCSP (I/O/P) PVDD A1 I Class-D power stage supply voltage. PVOUT A2 O Boost converter output. SW A3 I Boost and rectifying switch input. GND A4, C2, C4, D1 P Ground; all ground balls must be connected for proper functionality. OUT+ B1 O Positive audio output. GAIN B2 I Gain selection pin. AGC B3 I Enable and select AGC. VBAT B4 P Supply voltage. OUT– C1 O Negative audio output. END C3 I Enable for the Class-D amplifier; set to logic high to enable. IN+ D2 I Positive audio input. IN– D3 I Negative audio input. ENB D4 I Enable for the boost converter; set to logic high to enable. ORDERING INFORMATION TA PACKAGED DEVICES(1) PART NUMBER(2) SYMBOL 16-ball, 1.954mm × 1.954 mm WSCP TPA2015D1YZHR OEN –40°C to 85°C 16-ball, 1.954 mm × 1.954 mm WSCP TPA2015D1YZHT OEN (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI Web site at www.ti.com. (2) The YZH package is only available taped and reeled. The suffix “R” indicates a reel of 3000, the suffix “T” indicates a reel of 250. ABSOLUTE MAXIMUM RATINGS Over operating free–air temperature range, TA= 25°C (unless otherwise noted) (1) MIN MAX Supply voltage VBAT –0.3 V 6 V Input Voltage, VI IN+, IN– –0.3 V VBAT + 0.3 V Output continuous total power dissipation See the Thermal Information Table Operating free-air temperature range, TA –40°C 85°C Operating junction temperature range, TJ –40°C 150°C Storage temperature range, TSTG –65°C 150°C Minimum load impedance 6 Ω HBM 2000 V ESD Protection CDM 500 V MM 100 V (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability. Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Link(s): TPA2015D1 |
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