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CAT24C01VP2I-GT3 数据表(PDF) 2 Page - ON Semiconductor |
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CAT24C01VP2I-GT3 数据表(HTML) 2 Page - ON Semiconductor |
2 / 16 page CAT24C01, CAT24C02, CAT24C04, CAT24C08, CAT24C16 http://onsemi.com 2 Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Storage Temperature −65 to +150 °C Voltage on any pin with respect to Ground (Note 1) −0.5 to +6.5 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. During input transitions, voltage undershoot on any pin should not exceed −1 V for more than 20 ns. Voltage overshoot on pins A0, A1, A2 and WP should not exceed VCC + 1 V for more than 20 ns, while voltage on the I2C bus pins, SCL and SDA, should not exceed the absolute maximum ratings, irrespective of VCC. Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units NEND (Note 3) Endurance 1,000,000 Program / Erase Cycles TDR Data Retention 100 Years 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100 and JEDEC test methods. 3. Page Mode, VCC = 5 V, 25°C. Table 3. D.C. OPERATING CHARACTERISTICS (VCC = 1.8 V to 5.5 V, TA = −40°C to +125°C and VCC = 1.7 V to 5.5 V, TA = −40°C to +85°C, unless otherwise specified.) Symbol Parameter Test Conditions Min Max Units ICCR Read Current Read, fSCL = 400 kHz 1 mA ICCW Write Current Write, fSCL = 400 kHz 2 mA ISB Standby Current I/O Pins at GND or VCC, VCC < 3.6 V, TA < 85°C 1 mA I/O Pins at GND or VCC, TA < 125°C 2 IL I/O Pin Leakage Pin at GND or VCC 2 mA VIL Input Low Voltage −0.5 0.3 x VCC V VIH Input High Voltage A0, A1, A2 and WP 0.7 x VCC VCC + 0.5 V SCL and SDA 0.7 x VCC 5.5 VOL Output Low Voltage VCC > 2.5 V, IOL = 3 mA 0.4 VCC < 2.5 V, IOL = 1 mA 0.2 |
类似零件编号 - CAT24C01VP2I-GT3 |
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类似说明 - CAT24C01VP2I-GT3 |
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