CAT24C32

http://onsemi.com

2

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Storage Temperature

–65 to +150

°C

Voltage on any Pin with Respect to Ground (Note 1)

–0.5 to +6.5

V

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

Symbol

Parameter

Min

Units

Endurance

1,000,000

Program/Erase Cycles

Data Retention

100

Years

2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

Table 3. D.C. OPERATING CHARACTERISTICS

Symbol

Parameter

Test Conditions

Min

Max

Units

Read Current

1

mA

Write Current

2

mA

Standby Current

1

mA

3

5

I/O Pin Leakage

2

mA

Input Low Voltage

−0.5

V

Input High Voltage

V

Output Low Voltage

0.4

V

Output Low Voltage

0.2

V

Table 4. PIN IMPEDANCE CHARACTERISTICS

Symbol

Parameter

Conditions

Max

Units

SDA I/O Pin Capacitance

8

pF

Input Capacitance (other pins)

6

pF

WP Input Current

130

mA

120

80

2

4. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

5. When not driven, the WP pin is pulled down to GND internally. For improved noise immunity, the internal pull−down is relatively strong;

therefore the external driver must be able to supply the pull−down current when attempting to drive the input HIGH. To conserve power, as