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74AUP1T57GM 数据表(PDF) 11 Page - NXP Semiconductors |
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74AUP1T57GM 数据表(HTML) 11 Page - NXP Semiconductors |
11 / 17 page 74AUP1T57_2 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 02 — 3 August 2009 11 of 17 NXP Semiconductors 74AUP1T57 Low-power configurable gate with voltage-level translator [1] For measuring enable and disable times RL =5kΩ, for measuring propagation delays, setup and hold times and pulse width RL =1MΩ. Test data is given in Table 11. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to the output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 13. Load circuitry for switching times 001aac521 DUT RT VI VO VEXT VCC RL 5 k Ω CL G Table 11. Test data Supply voltage Load VEXT VCC CL RL[1] tPLH, tPHL tPZH, tPHZ tPZL, tPLZ 2.3 V to 3.6 V 5 pF, 10 pF, 15 pF and 30 pF 5 k Ω or 1 MΩ open GND 2 × VCC |
类似零件编号 - 74AUP1T57GM |
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类似说明 - 74AUP1T57GM |
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