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H57V2562GTR-50J 数据表(PDF) 11 Page - Hynix Semiconductor

部件名 H57V2562GTR-50J
功能描述  256Mb Synchronous DRAM based on 4M x 4Bank x16 I/O
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制造商  HYNIX [Hynix Semiconductor]
网页  http://www.skhynix.com/kor/main.do
标志 HYNIX - Hynix Semiconductor

H57V2562GTR-50J 数据表(HTML) 11 Page - Hynix Semiconductor

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Rev 1.0 / Aug. 2009
11
111
Synchronous DRAM Memory 256Mbit
H57V2562GTR-xxI Series
AC CHARACTERISTICS I (AC operating conditions unless otherwise noted)
Note:
1. Assume tR / tF (input rise and fall time) is 1ns. If tR & tF > 1ns, then [(tR+tF)/2-1]ns should be added to the parameter.
2. Access time to be measured with input signals of 1V/ns edge rate, from 0.8V to 0.2V. If tR > 1ns, then (tR/2-0.5)ns should be added
to the parameter.
Parameter
Speed
(MHz)
200
166
133
Unit
Note
Min
Max
Min
Max
Min
Max
System Clock Cycle Time
CL = 3
tCK3
5.0
1000
6.0
1000
7.5
1000
ns
CL = 2
tCK2
-
-
1000
10
1000
ns
Clock High Pulse Width
tCHW
2.0
-
2.5
-
2.5
-
ns
1
Clock Low Pulse Width
tCLW
2.0
-
2.5
-
2.5
-
ns
1
Access Time From Clock
CL = 3
tAC3
-
4.5
-
5.4
-
5.4
ns
2
CL = 2
tAC2
--
---
6
ns
2
Data-out Hold Time
tOH
2.0
-
2.0
-
2.5
-
ns
Data-Input Setup Time
tDS
1.5
-
1.5
-
1.5
-
ns
1
Data-Input Hold Time
tDH
0.8
-
0.8
-
0.8
-
ns
1
Address Setup Time
tAS
1.5
-
1.5
-
1.5
-
ns
1
Address Hold Time
tAH
0.8
-
0.8
-
0.8
-
ns
1
CKE Setup Time
tCKS
1.5
-
1.5
-
1.5
-
ns
1
CKE Hold Time
tCKH
0.8
-
0.8
-
0.8
-
ns
1
Command Setup Time
tCS
1.5
-
1.5
-
1.5
-
ns
1
Command Hold Time
tCH
0.8
-
0.8
-
0.8
-
ns
1
CLK to Data Output in Low-Z Time
tOLZ
1.0
-
1.0
-
1.0
-
ns
CLK to Data Output in
High-Z Time
CL = 3
tOHZ3
-
4.5
2.7
5.4
2.7
5.4
ns
CL = 2
tOHZ2
--
--
3
6
ns


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