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SN74TVC3010PW 数据表(PDF) 4 Page - Texas Instruments |
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SN74TVC3010PW 数据表(HTML) 4 Page - Texas Instruments |
4 / 11 page SN74TVC3010 10-BIT VOLTAGE CLAMP SCDS088A – APRIL 1999 – REVISED JUNE 1999 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 PARAMETER MEASUREMENT INFORMATION tPLHREF tPHLREF 2.5 V 0 V 2.5 V VOL Input GATETester VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES Output Reference TESTER CALIBRATION SETUP (see Note D) VOL Output Device Under Test tPLHDUT tPLH (see Note E) tPHLDUT tPHL (see Note F) 2.5 V 200 k Ω 3.3 V RDPU = 150 Ω Open-Drain Test Interface Motherboard Interface 2 A1 (VREF) 1 GATE 24 B1 (VBIAS) 23 VDPU TVC3010 NOTES: A. CL includes probe and jig capacitance. B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns. C. The outputs are measured one at a time with one transition per measurement. D. Test procedure: tPLHREF and tPHLREF are obtained by measuring the propagation delay of a reference measuring point. tPLHDUT and tPHLDUT are obtained by measuring the propagation delay of the device under test. E. tPLH = tPLHDUT – tPLHREF F. tPHL = tPHLDUT – tPHLREF B2 22 RDPU = 150 Ω RDPU = 150 Ω RDPU = 150 Ω B3 21 B4 20 B11 13 3 A2 (VS) 4 A3 (VS) 5 A4 (VS) 12 A11 (VS) 1.25 V 1.25 V 1.25 V 1.25 V 1.25 V 1.25 V Figure 1. Tester Calibration Setup and Voltage Waveforms |
类似零件编号 - SN74TVC3010PW |
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类似说明 - SN74TVC3010PW |
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