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SN74ABTH18646A 数据表(PDF) 1 Page - Texas Instruments |
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SN74ABTH18646A 数据表(HTML) 1 Page - Texas Instruments |
1 / 37 page SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D – AUGUST 1993 – REVISED JULY 1996 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors D B-Port Outputs of ’ABTH182646A Devices Have Equivalent 25- Ω Series Resistors, So No External Resistors Are Required D State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design D One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency D SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes D Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings 1B4 1B5 1B6 GND 1B7 1B8 1B9 VCC NC 2B1 2B2 2B3 2B4 GND 2B5 2B6 2B7 1A3 1A4 1A5 GND 1A6 1A7 1A8 1A9 NC VCC 2A1 2A2 2A3 GND 2A4 2A5 2A6 28 29 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 30 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 31 32 33 34 87 6 5 4 93 1 68 67 2 35 36 37 38 39 66 65 27 64 63 62 61 40 41 42 43 SN54ABTH18646A, SN54ABTH182646A . . . HV PACKAGE (TOP VIEW) NC – No internal connection Copyright © 1996, Texas Instruments Incorporated UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, and EPIC- ΙΙB are trademarks of Texas Instruments Incorporated. On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
类似零件编号 - SN74ABTH18646A |
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类似说明 - SN74ABTH18646A |
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