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SN74ABTH182504A 数据表(PDF) 2 Page - Texas Instruments |
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SN74ABTH182504A 数据表(HTML) 2 Page - Texas Instruments |
2 / 35 page SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C – AUGUST 1993 – REVISED JULY 1996 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 18 19 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 20 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 21 22 23 24 63 62 61 60 59 64 58 56 55 54 57 25 26 27 28 29 53 52 17 51 50 49 30 31 32 A4 A5 A6 GND A7 A8 A9 A10 VCC A11 A12 A13 GND A14 A15 A16 B5 B6 B7 GND B8 B9 B10 VCC B11 B12 B13 B14 GND B15 B16 B17 SN74ABTH18504A, SN74ABTH182504A . . . PM PACKAGE (TOP VIEW) description The ’ABTH18504A and ’ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE ™ universal bus transceivers. Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA), clock-enable (CLKENAB and CLKENBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while CLKENAB is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and CLKENAB is low, A-bus data is stored on a low-to-high transition of CLKAB. When OEAB is low, the B outputs are active. When OEAB is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the OEBA, LEBA, CLKENBA, and CLKBA inputs. In the test mode, the normal operation of the SCOPE ™ universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990. |
类似零件编号 - SN74ABTH182504A |
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类似说明 - SN74ABTH182504A |
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