CY74FCT163244

CY74FCT163H244

2

(Above which the useful life may be impaired. For user guide-

lines, not tested.)

Storage Temperature ................................. –55

°C to +125°C

Ambient Temperature with

Power Applied............................................ –55

°C to +125°C

Supply Voltage Range ..................................... 0.5V to +4.6V

DC Input Voltage ........................................... –0.5V to +7.0V

DC Output Voltage......................................... –0.5V to +7.0V

DC Output Current

(Maximum Sink Current/Pin) ........................–60 to +120 mA

Power Dissipation .......................................................... 1.0W

Pin Description

Name

Description

OE

Three-State Output Enable Inputs (Active LOW)

A

Y

Three-State Outputs

Inputs

Outputs

OE

A

Y

L

L

L

L

H

H

H

X

Z

Operating Range

Range

Ambient

Temperature

Industrial

–40

°C to +85°C

2.7V to 3.6V

Parameter

Description

Test Conditions

Min.

Max.

Unit

Input HIGH Voltage

All Inputs

2.0

5.5

V

Input LOW Voltage

0.8

V

100

mV

Input Clamp Diode Voltage

–0.7

– 1.2

V

Input HIGH Current

±1

µA

Input LOW Current

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

–60

–135

–240

mA

Power-Off Disable

±100

µA

Quiescent Power Supply Current

0.1

10

µA

∆I

CC

Quiescent Power Supply Current

(TTL inputs HIGH)

[8]

2.0

30

µA

Notes:

1.

On the CY74FCT163H244, these pins have “bus hold.”

2.

H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = High Impedance.

3.

Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature

range.

4.

5.

6.

This parameter is specified but not tested.

7.

Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of

a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter

8.