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SN74ABT18504 数据表(PDF) 3 Page - Texas Instruments

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部件名 SN74ABT18504
功能描述  SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
Download  34 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

SN74ABT18504 数据表(HTML) 3 Page - Texas Instruments

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SN54ABT18504, SN74ABT18504
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS108B – AUGUST 1992 – REVISED JUNE 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
3
description (continued)
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI),
test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform
other testing functions such as parallel signature analysis on data inputs and pseudo-random pattern generation
from data outputs. All testing and scan operations are synchronized to the TAP interface.
Additional flexibility is provided in the test mode through the use of two boundary scan cells (BSCs) for each
I/O pin. This allows independent test data to be captured and forced at either bus (A or B). A PSA/COUNT
instruction is also included to ease the testing of memories and other circuits where a binary count addressing
scheme is useful.
The SN54ABT18504 is characterized for operation over the full military temperature range of – 55
°C to 125°C.
The SN74ABT18504 is characterized for operation from – 40
°C to 85°C.
FUNCTION TABLE†
(normal mode, each register)
INPUTS
OUTPUT
OEAB
LEAB
CLKENAB
CLKAB
A
B
L
L
L
L
X
B0‡
L
LL
LL
L
LL
HH
L
LH
X
X
B0‡
L
HX
X
L
L
L
HX
X
H
H
H
X
X
X
X
Z
† A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA,
LEBA, CLKENBA, and CLKBA.
‡ Output level before the indicated steady-state input conditions were
established.


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