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RD38F2030W0ZDQ0 数据表(PDF) 27 Page - Numonyx B.V |
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RD38F2030W0ZDQ0 数据表(HTML) 27 Page - Numonyx B.V |
27 / 46 page November 2007 Datasheet Order Number: 251407-13 27 32WQ and 64WQ Family with Asynchronous RAM 7.4 Device AC Test Conditions Figure 10: Transient Input/Output Reference Waveform Note: AC test inputs are driven to VCCQ, P-VCC for logic “1” and 0.0 V for logic “0”. input/output timing begins/ends at VCCQ/2, P-VCC/2. Input rise and fall time (10% to 90%) < 5 ns. Worse case speed occurs at VCC = VCCMin. Figure 11: Transient Equivalent Testing Load Circuit Notes: 1. Test configuration component value for worst case specification conditions. 2. CL includes jig capacitance. Test Points V CCQ/2, P-V CC/2 V CCQ/2, P-V CC/2 Input Output 0 V V CCQ, P-VCC I/O Output Z O = 50 Ohms CL= 30 pf 50 Ohms P-V CC /2 = VCCQ/2 |
类似零件编号 - RD38F2030W0ZDQ0 |
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类似说明 - RD38F2030W0ZDQ0 |
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