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DAC8871SPW Datasheet(数据表) 2 Page - Burr-Brown (TI)

[Old version datasheet] Texas Instruments acquired Burr-Brown Corporation. Click here to check the latest version.
部件型号  DAC8871SPW
说明  16-Bit, Single-Channel, ±18V Output (Unbuffered), Ultra-Low Power, Serial Interface DIGITAL-TO-ANALOG CONVERTER
下载  21 Pages
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制造商  BURR-BROWN [Burr-Brown (TI)]
网页  http://www.burr-brown.com
标志 

 
 2 page
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ABSOLUTE MAXIMUM RATINGS
(1)
DAC8871
SBAS396 – JUNE 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION(1)
MINIMUM
RELATIVE
DIFFERENTIAL
SPECIFIED
ACCURACY
NONLINEARITY
TEMPERATURE
PACKAGE
PACKAGE-
PACKAGE
PRODUCT
(LSB)
(LSB)
RANGE
MARKING
LEAD
DESIGNATOR
DAC8871B
±1
±1
–40
°C to +105°C
8871
TSSOP-16
PW
DAC8871
±3
±1
–40
°C to +105°C
8871
TSSOP-16
PW
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI
website at www.ti.com.
over operating free-air temperature range (unless otherwise noted).
DAC8871
UNIT
VDD to GND
–0.3 to +7
V
Digital input voltage to GND
–0.3 to (VDD + 0.3)
V
AGND to DGND
–0.3 to +0.3
V
VCC to VSS
–0.3 to +39.6
V
VCC to AGND
–0.3 to +19.8
V
VSS to AGND
+0.3 to –19.8
V
VREFH to VREFL
–0.3 to +39.6
V
VREFH to AGND
–0.3 to +19.8
V
VREFL to AGND
–19.8 to +17.5
V
Operating temperature range
–40 to +105
°C
Storage temperature range
–65 to +150
°C
Maximum junction temperature (TJ max)
+150
°C
Power dissipation
(TJ max - TA)/θJA
W
Thermal impedance,
θ
JA
TSSOP-16
161.4
°C/W
(1)
Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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