HCF4010 datasheet(4/14 Pages) STMICROELECTRONICS

部件名	HCF4010

功能描述	DUAL 2-INPUT NAND BUFFER/DRIVER

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制造商	STMICROELECTRONICS [STMicroelectronics]

网页	http://www.st.com

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4 / 14 page

STATIC ELECTRICAL CHARACTERISTICS (continued)

Test Conditions

Val ue

V I

V O

|I O |V DD

T Lo w*

25

°CT Hig h*

Symbol

Parameter

(V)

(

µA) (V)

Min. Max. Min. Typ. Max. Min. Max.

Unit

I OL

Output

Sink

Current

HCC

Types

5

0.4

5

21

16

32

12

mA

51

5

44

30

68

25

10

0.5

10

49

37

74

28

10

1

10

89

68

136

51

15

0.5

15

66

50

100

38

HCF

Types

5

0.4

5

17

13.6

32

12

5

1

5

35.7

25.5

68

22

10

0.5

10

39.1

31.4

74

27

10

1

10

72.2

57.8

136

51

15

0.5

15

53.5

42.5

100

37

I OH

Output Drive

Current

No Internal Pull-up Device

mA

I IH,IIL

Input

Leakage

Current

HCC

Types

0/18

Any Input

18

± 0.1

±10–5 ± 0.1

± 1

µA

HCF

Types

0/15

15

± 0.3

±10–5 ± 0.3

± 1

I OH,IOL

***

3-State

Output

Leakage

Current

HCC

Types

0/18

18

2

±10–4

220

µA

HCF

Types

0/15

15

2

±10–4

220

CI

Input Capacitance

Any Input

5

7.5

pF

CO

Output

Capacitance

Any Output

30

pF

*TLow =– 55

°C for HCC device ; – 40°C for HCF device.

*THigh = + 125

°C for HCC device ; + 85°C for HCF device.

The Noise Margin, full package temperature range, RL to VDD =10k

Ω : 1V min with VDD = 5V, 2V min with VDD = 10V, 2.5V min with VDD = 15V.

** Measured with external pull-up resistor, RL = 10k

Ω to VDD.

*** Forced output disabled.

HCC/HCF40107B

4/14

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