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ADR395 数据表(PDF) 6 Page - Analog Devices |
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ADR395 数据表(HTML) 6 Page - Analog Devices |
6 / 33 page AD5762R Preliminary Technical Data Rev. PrA | Page 6 of 33 AC PERFORMANCE CHARACTERISTIC AVDD = 11.4 V to 16.5 V, AVSS = −11.4 V to −16.5 V, AGND = DGND = REFGND = PGND = 0 V; REFA, REFB= 5 V external; DVCC = 2.7 V to 5.25 V, RLOAD = 10 kΩ, CL = 200 pF. All specifications TMIN to TMAX, unless otherwise noted. Guaranteed by design and characterization, not production tested. Table 2. Parameter C Grade Unit Test Conditions/Comments DYNAMIC PERFORMANCE1 Output Voltage Settling Time 8 µs typ Full-scale step to ±1 LSB 10 µs max 2 µs typ 512 LSB step settling Slew Rate 5 V/µs typ Digital-to-Analog Glitch Energy 8 nV-s typ Glitch Impulse Peak Amplitude 25 mV max Channel-to-Channel Isolation 80 dB typ DAC-to-DAC Crosstalk 8 nV-s typ Digital Crosstalk 2 nV-s typ Digital Feedthrough 2 nV-s typ Effect of input bus activity on DAC outputs Output Noise (0.1 Hz to 10 Hz) 0.1 LSB p-p typ Output Noise (0.1 Hz to 100 kHz) 45 µV rms max 1/f Corner Frequency 1 kHz typ Output Noise Spectral Density 60 nV/√Hz typ Measured at 10 kHz Complete System Output Noise Spectral Density2 80 nV/√Hz typ Measured at 10 kHz 1 Guaranteed by design and characterization; not production tested. 2 Includes noise contributions from integrated reference buffers,16-bit DAC and output amplifier. |
类似零件编号 - ADR395 |
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类似说明 - ADR395 |
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