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74LVC1G3157GM 数据表(PDF) 8 Page - NXP Semiconductors |
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74LVC1G3157GM 数据表(HTML) 8 Page - NXP Semiconductors |
8 / 22 page 74LVC1G3157_2 © NXP B.V. 2007. All rights reserved. Product data sheet Rev. 02 — 18 September 2007 8 of 22 NXP Semiconductors 74LVC1G3157 2-channel analog multiplexer/demultiplexer 10.3 ON resistance test circuit and graphs RON =VSW / ISW. (1) VCC = 1.8 V. (2) VCC = 2.5 V. (3) VCC = 2.7 V. (4) VCC = 3.3 V. (5) VCC = 5.0 V. Fig 8. Test circuit for measuring ON resistance Fig 9. Typical ON resistance as a function of input voltage; Tamb = 25 °C 001aac360 S Z Y0 Y1 VCC GND switch switch 1 1 2 2 VIH VIL S VIL or VIH VI ISW VSW V VI (V) 05 4 23 1 mna673 20 10 30 40 RON ( Ω) 0 (1) (2) (3) (4) (5) (1) Tamb = 125 °C. (2) Tamb =85 °C. (3) Tamb =25 °C. (4) Tamb = −40 °C. (1) Tamb = 125 °C. (2) Tamb =85 °C. (3) Tamb =25 °C. (4) Tamb = −40 °C. Fig 10. ON resistance as a function of input voltage; VCC = 1.8 V Fig 11. ON resistance as a function of input voltage; VCC = 2.5 V VI (V) 0 2.0 1.6 0.8 1.2 0.4 001aaa712 25 35 15 45 55 RON ( Ω) 5 (4) (3) (2) (1) VI (V) 0 2.5 2.0 1.0 1.5 0.5 001aaa708 9 11 7 13 15 RON ( Ω) 5 (1) (2) (3) (4) |
类似零件编号 - 74LVC1G3157GM |
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类似说明 - 74LVC1G3157GM |
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