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Issue A

ML145053

LANSDALE Semiconductor, Inc.

A/D CONVERTER ELECTRICAL CHARACTERISTICS

(Full Temperature and Voltage Ranges per Operation Ranges Table)

Characteristic

Definition and Test Conditions

Guaranteed

Limit

Unit

Resolution

Number of bits resolved by the A/D converter

10

Bits

Maximum Nonlinearity

Maximum difference between an ideal and an actual ADC transfer function

± 1

LSB

Maximum Zero Error

Difference between the maximum input voltage of an ideal and an actual

ADC for zero output code

± 1

LSB

Maximum Full-Scale Error

Difference between the minimum input voltage of an ideal and an actual

ADC for full-scale output code

± 1

LSB

Maximum Total Unadjusted Error

Maximum sum of nonlinearity, zero error, and full-scale error

± 1

LSB

Maximum Quantization Error

Uncertainty due to converter resolution

± 1/2

LSB

Absolute Accuracy

Difference between the actual input voltage and the full-scale weighted

equivalent of the binary output code, all error sources included

± 1-1/2

LSB

Maximum Conversion Time

Total time to perform a single analog-to-digital conversion

44

µs

Data Transfer Time

Total time to transfer digital serial data into and out of the device

10 to 16

SCLK

cycles

Sample Acquisition Time

Analog input acquisition time window

6

SCLK

cycles

Minimum Total Cycle Time

Total time to transfer serial data, sample the analog input, and perform the

conversion; SCLK = 2.1 MHz

49

µs

Maximum Sample Rate

Rate at which analog inputs may be sampled; SCLK = 2.1 MHz

20.4

ks/s