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SN74ABT541BPWR Datasheet(数据表) 3 Page - Texas Instruments

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部件型号  SN74ABT541BPWR
说明  OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
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Absolute Maximum Ratings
(1)
Recommended Operating Conditions
(1)
SN54ABT541, SN74ABT541B
OCTAL BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS093L – DECEMBER 1993 – REVISED DECEMBER 2006
over recommended operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
VCC
Supply voltage range
–0.5
7
V
VI
Input voltage range(2)
–0.5
7
V
VO
Voltage range applied to any output in the high or power-off state
–0.5
5.5
V
IO
Current into any output in the low state
SN54ABT541
96
mA
SN74ABT541B
128
IIK
Input clamp current
VI < 0
–18
mA
IOK
Output clamp current
VO < 0
–50
mA
θ
JA
Package thermal impedance(3)
DB package
115
DW package
97
°C/W
N package
67
PW package
128
Tstg
Storage temperature range
–65
150
°C
(1)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
(3)
The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace length
of zero.
over recommended operating free-air temperature range (unless otherwise noted)
SN54ABT541
SN74ABT541B
UNIT
MIN
MAX
MIN
MAX
VCC
Supply voltage
4.5
5.5
4.5
5.5
V
VIH
High-level input voltage
2
2
V
VIL
Low-level input voltage
0.8
0.8
V
IOH
High-level output current
–24
–32
mA
IOL
Low-level output current
48
64
mA
∆t/∆v
Input transition rise or fall rate
5
5
ns/V
∆t/∆V
CC
Power-up ramp rate
200
µs/V
TA
Operating free-air temperature
–55
125
–40
85
°C
(1)
All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
3
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