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MC74HC244ADT 数据表(PDF) 5 Page - ON Semiconductor |
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MC74HC244ADT 数据表(HTML) 5 Page - ON Semiconductor |
5 / 8 page MC74HC244A http://onsemi.com 5 TEST CIRCUITS *Includes all probe and jig capacitance CL* TEST POINT DEVICE UNDER TEST OUTPUT Figure 3. Test Circuit *Includes all probe and jig capacitance CL* TEST POINT DEVICE UNDER TEST OUTPUT Figure 4. Test Circuit CONNECT TO VCC WHEN TESTING tPLZ AND tPZL. CONNECT TO GND WHEN TESTING tPHZ AND tPZH. 1 kW PIN DESCRIPTIONS INPUTS A1, A2, A3, A4, B1, B2, B3, B4 (Pins 2, 4, 6, 8, 11, 13, 15, 17) Data input pins. Data on these pins appear in noninverted form on the corresponding Y outputs, when the outputs are enabled. CONTROLS Enable A, Enable B (Pins 1, 19) Output enables (active−low). When a low level is applied to these pins, the outputs are enabled and the devices function as noninverting buffers. When a high level is applied, the outputs assume the high impedance state. OUTPUTS YA1, YA2, YA3, YA4, YB1, YB2, YB3, YB4 (Pins 18, 16, 14, 12, 9, 7, 5, 3) Device outputs. Depending upon the state of the output−enable pins, these outputs are either noninverting outputs or high−impedance outputs. LOGIC DETAIL DATA INPUT A OR B ENABLE A OR ENABLE B TO THREE OTHER A OR B INVERTERS ONE OF 8 INVERTERS YA OR YB VCC |
类似零件编号 - MC74HC244ADT |
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类似说明 - MC74HC244ADT |
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