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1SMB5.0AT3 数据表(PDF) 6 Page - ON Semiconductor |
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1SMB5.0AT3 数据表(HTML) 6 Page - ON Semiconductor |
6 / 7 page ![]() 1SMB5.0AT3 Series http://onsemi.com 6 VL V Vin Vin (TRANSIENT) VL td V Vin (TRANSIENT) OVERSHOOT DUE TO INDUCTIVE EFFECTS tD = TIME DELAY DUE TO CAPACITIVE EFFECT t t Figure 6. Figure 7. Figure 8. Typical Derating Factor for Duty Cycle 1 ms 10 ms 1 0.7 0.5 0.3 0.05 0.1 0.2 0.01 0.02 0.03 0.07 100 ms 0.1 0.2 0.5 2 5 10 50 1 20 100 D, DUTY CYCLE (%) PULSE WIDTH 10 ms UL RECOGNITION The entire series has Underwriters Laboratory Recognition for the classification of protectors (QVGV2) under the UL standard for safety 497B and File #E210057. Many competitors only have one or two devices recognized or have recognition in a non-protective category. Some competitors have no recognition at all. With the UL497B recognition, our parts successfully passed several tests including Strike Voltage Breakdown test, Endurance Conditioning, Temperature test, Dielectric Voltage-Withstand test, Discharge test and several more. Whereas, some competitors have only passed a flammability test for the package material, we have been recognized for much more to be included in their Protector category. |
类似零件编号 - 1SMB5.0AT3 |
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类似说明 - 1SMB5.0AT3 |
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