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PLUS173-10 Datasheet(数据表) 4 Page - NXP Semiconductors

部件型号  PLUS173-10
说明  Programmable logic array (22 x 42 x 10)
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制造商  PHILIPS [NXP Semiconductors]
网页  http://www.nxp.com
标志 PHILIPS - NXP Semiconductors

PLUS173-10 Datasheet(HTML) 4 Page - NXP Semiconductors

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Philips Semiconductors Programmable Logic Devices
Product specification
PLUS173–10
Programmable logic array
(22
× 42 × 10)
October 22, 1993
44
DC ELECTRICAL CHARACTERISTICS
0
°C ≤ Tamb ≤ +75°C, 4.75 ≤ VCC ≤ 5.25V
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP1
MAX
UNIT
Input voltage2
VIL
Low
VCC = MIN
0.8
V
VIH
High
VCC = MAX
2.0
V
VIC
Clamp
VCC = MIN, IIN = –12mA
–0.8
–1.2
V
Output voltage2
VCC = MIN
VOL
Low4
IOL = 15mA
0.4
0.5
V
VOH
High5
IOH = –2mA
2.4
2.9
V
Input current9
VCC = MAX
IIL
Low
VIN = 0.45V
–20
–100
µA
IIH
High
VIN = VCC
1
40
µA
Output current
VCC = MAX
IO(OFF)
Hi-Z state8
VOUT = 2.7V
0
80
µA
VOUT = 0.45V
–15
–140
IOS
Short circuit3, 5, 6
VOUT = 0V
–15
–30
–70
mA
ICC
VCC supply current7
VCC = MAX
170
210
mA
Capacitance
VCC = 5V
IIN
Input
VIN = 2.0V
8
pF
CB
I/O
VB = 2.0V
15
pF
NOTES:
1. All typical values are at VCC = 5V, Tamb = +25°C.
2. All voltage values are with respect to network ground terminal.
3. Test one at a time.
4. Measured with inputs I0 – I4 = 0V, inputs I5 – I9 = 4.5V, I11 = 4.5V and I10 = 10V. For outputs B0 – B4 and for outputs B5 – B9 apply the
same conditions except I11 = 0V.
5. Same conditions as Note 4 except input I11 = +10V.
6. Duration of short circuit should not exceed 1 second.
7. ICC is measured with inputs I0 – I11 and B0 – B9 = 0V. Part in Virgin State.
8. Leakage values are a combination of input and output leakage.
9. IIL and IIH limits are for dedicated inputs only (I0 – I11).




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