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NB2872A 数据表(PDF) 3 Page - ON Semiconductor |
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NB2872A 数据表(HTML) 3 Page - ON Semiconductor |
3 / 6 page NB2872A http://onsemi.com 3 Figure 3. Modulation Profile Table 3. MAXIMUM RATINGS Symbol Description Rating Unit VDD, VIN Voltage on any pin with respect to Ground 0.5 to + 7.0 V TSTG Storage Temperature −65 to +125 °C TA Operating Temperature 0 to 70 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. Table 4. DC ELECTRICAL CHARACTERISTICS (Test Conditions: All parameters are measured at room temperature 25°C) Symbol Description Min Typ Max Unit VIL Input LOW Voltage GND − 0.3 0.8 V VIH Input HIGH Voltage 2.0 VDD + 0.3 V IIL Input LOW Current −35 mA IIH Input HIGH Current 35 mA IXOL XOUT Output LOW Current (@ 4.0 V, VDD = 3.3 V) 3 mA IXOH XOUT Output HIGH Current (@ 2.5 V, VDD = 3.3 V) 3 mA VOL Output LOW Voltage (VDD = 3.3 V, IOL = 20 mA) 0.4 V VOH Output HIGH Voltage (VDD = 3.3 V, IOH = 20 mA) 2.5 V IDD Static Supply Current (Note 1) 1.5 mA ICC Dynamic Supply Current (3.3 V, 30 MHz, and 15 pF loading) 6 mA VDD Operating Voltage 3.0 3.3 3.6 V tON Powerup Time (first locked cycle after powerup) (Note 2) 10 mS ZOUT Clock Output Impedance 50 W NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 1. XIN/CLKIN pin is pulled low. 2. VDD and XIN/CLKIN input are stable. |
类似零件编号 - NB2872A |
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类似说明 - NB2872A |
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