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AN1504 数据表(PDF) 4 Page - ON Semiconductor

部件名 AN1504
功能描述  Metastability and the ECLinPS Family
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制造商  ONSEMI [ON Semiconductor]
网页  http://www.onsemi.com
标志 ONSEMI - ON Semiconductor

AN1504 数据表(HTML) 4 Page - ON Semiconductor

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Metastable Equations
Flip−flop propagation delay as a function of the input
signal is represented in Figure 6.
TD
TP
TMAX
T0
TF
DATA
INPUT
TIME
Figure 6. Flip−Flop Response Time Plot
Dt
TW(TD)
The ordinate is the flip−flop propagation delay time, and
the abscissa is the time that data arrives at the flip−flop input
relative to reference time, T0. For devices with positive
set−up times T0 represents the clock transition time with the
difference between T0 and TMAX being the minimum
allowable set−up time. Thus data arriving before time TMAX
will elicit a nominal propagation delay, TP, when clocked.
For data appearing between times TMAX and TF the
propagation delay will be longer than TP because the set−up
and/or hold times have been violated; and the device enters
the metastable state. Data occurring at the input after time TF
will have no affect on the output, hence the output does not
change and the propagation delay is defined as zero.
For devices with zero or negative set−up times the same
response plot applies, however the abscissa is shifted such
that the value of T0 is no longer the clock transition time.
The same concepts are valid for derivation of metastability
equations for each case: positive, negative or zero set−up
and hold times. To clarify the flip−flop response plot,
Figure 7 illustrates a case in which the propagation delay is
TP. Data arrives at time TA, allowing the proper set−up time
prior to a clock transition and is maintained at this level for
the specified hold time. Figure 8 is an example in which the
propagation delay is longer than TP since the data arrives at
time TA, violating the set−up time.
Using the response plot in Figure 6, Stoll1 developed the
concept of a failure window to facilitate the characterization
of metastability. The value of TW(TD) is the width of the
window for which a propagation delay of time duration TD
occurs, and is the range of data input times relative to the
clock input for which a failure will occur. The value of TD
is the maximum allowable propagation delay; delays longer
than TD constitute a failure. The failure window is described
mathematically as:
TW(TD) + TP
10(Dt) t
(eq. 1)
Where:
TW(TD) Failure Window Width
TP
Nominal Propagation Delay
TD
Delay After Clock That
Constitutes a Failure
t
Flip−Flop Resolution Time Constant
Dt
Excess Delay (TD − TP)
T0
TMAX
TA
CLOCK SIGNAL
TIME
DATA SIGNAL
Figure 7. Proper Set−Up and Hold Times
T0
TMAX TA
CLOCK SIGNAL
DATA SIGNAL
TIME
Figure 8. Violation of Set−Up and Hold Times


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