74F395 datasheet(4/7 Pages) PHILIPS

部件名	74F395

功能描述	4-bit cascadable shift register 3-State

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制造商	PHILIPS [NXP Semiconductors]

网页	http://www.nxp.com

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4 / 7 page

Philips Semiconductors

Product specification

74F395

4-bit cascadable shift register (3-State)

1990 Oct 23

4

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS1

MIN

TYP2

MAX

UNIT

VOH

High-level output voltage

Qs

VCC = MIN,

VIL = MAX,

VIH=MIN

IOH=–1mA

±10%VCC

2.5

V

VOH

High-level output voltage

Qs

VCC = MIN,

VIL = MAX,

VIH=MIN

IOH=–1mA

±5%VCC

2.7

3.4

V

VOH

High-level output voltage

Q0–Q3

VIL = MAX,

VIH=MIN

IOH =–3mA

±10%VCC

2.4

V

Q0–Q3

IH=MIN

IOH =–3mA

±5%VCC

2.7

V

VOL

Low-level output voltage

VCC = MIN,

VIL = MAX,

VIH = MIN,

IOL = MAX

±10%VCC

0.35

0.50

V

VOL

Low-level output voltage

VIL = MAX,

VIH = MIN,

IOL = MAX

±5%VCC

0.35

0.50

V

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73

–1.2

V

II

Input current at maximum input voltage

VCC = MAX, VI = 7.0V

100

µA

IIH

High-level input current

VCC = MAX, VI = 2.7V

20

µA

IIL

Low-level input current

VCC = MAX, VI = 0.5V

–0.6

mA

IOZH

Off-state output current High

level of voltage applied

Q0–Q3

only

VCC = MAX, VO = 2.7V

50

µA

IOZL

Off-state output current Low

level of voltage applied

Q0–Q3

only

VCC = MAX, VO = 0.5V

–50

µA

IOS

Short-circuit output current3

VCC = MAX

–60

–150

mA

ICC

Supply current (total)

ICCH

VCC = MAX

MR=PE=Dn=Ds=4.5V,

OE=GND, CP=

#

33

48

mA

ICC

Supply current (total)

ICCL

VCC = MAX

MR=OE=Dn=Ds=GND,

PE=4.5V, CP=

#

35

50

mA

ICCZ

MR=Dn=Ds=GND,

OE=4.5V

32

46

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

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