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GS816273C-225I 数据表(PDF) 11 Page - GSI Technology |
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GS816273C-225I 数据表(HTML) 11 Page - GSI Technology |
11 / 25 page GS816273C-250/225 Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. Rev: 1.03 7/2004 11/25 © 2002, GSI Technology Note: These parameters are sample tested. Capacitance (TA = 25oC, f = 1 MHZ, VDD = 2.5 V) Parameter Symbol Test conditions Typ. Max. Unit Input Capacitance CIN VIN = 0 V 45 pF Input/Output Capacitance CI/O VOUT = 0 V 67 pF AC Test Conditions Parameter Conditions Input high level VDD – 0.2 V Input low level 0.2 V Input slew rate 1 V/ns Input reference level VDD/2 Output reference level VDDQ/2 Output load Fig. 1 Notes: 1. Include scope and jig capacitance. 2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted. 3. Device is deselected as defined by the Truth Table. 20% tKC VSS – 2.0 V 50% VSS VIH Undershoot Measurement and Timing Overshoot Measurement and Timing 20% tKC VDD + 2.0 V 50% VDD VIL DQ VDDQ/2 50 Ω 30pF* Output Load 1 * Distributed Test Jig Capacitance |
类似零件编号 - GS816273C-225I |
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类似说明 - GS816273C-225I |
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